Journal Articles by M. Piccoli

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J. G. Molleja, J. Bürgi, G. Kellermann, A. Craievich, R. Neuenschwander, P.-Y. Jouan, M. Djouadi, M. Piccoli, et al.
Synchrotron radiation applied to real-Time studies of the kinetics of growth of aluminum nitride thin multilayers
Journal of Physical Chemistry B (cited By 0), 123(7), 1679-1687, 2019
aluminum nitride amorphous films film preparation growth kinetics magnetrons nitrides reactive sputtering superconducting films synchrotron radiation synchrotrons textures x ray diffraction aluminum nitride thin films controlled deposition experimental devices operation parameters polycrystalline structure real-time recording real-time x-ray diffraction superconducting wiggler thin films
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J. Bürgi, J. Molleja, R. Bolmaro, M. Piccoli, E. Bemporad, A. Craievich, and J. Feugeas
(1011) preferential orientation of polycrystalline AlN grown on SiO2/Si wafers by reactive sputter magnetron technique
EPJ Applied Physics (cited By 3), 74(1), 2016
aluminum nitride magnetrons oxide films reactive sputtering semiconductor device manufacture silicon wafers substrates x ray diffraction aluminum nitride (aln) crystalline structure grazing incidence x-ray diffraction polar structures pole figure polycrystalline preferential orientation semiconductor industry iii-v semiconductors
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J. G. Molleja, M. Milanese, B. Gõmez, R. Moroso, M. Piccoli, J. Niedbalski, J. Bürgi, E. Bemporad, et al.
Behavior of nitrided and carburized AISI 904-L stainless steels under severe light ion beam irradiation with plasma focus
Surface and Interface Analysis (cited By 6), 47(6), 728-737, 2015
austenite deuterium electric discharges energy dispersive spectroscopy glow discharges helium ion beams plasma applications plasma devices plasma stability surface discharges x ray diffraction x ray spectroscopy characterization techniques energy dispersive x ray spectroscopy expanded austenite fundamental properties grazing incidence x-ray diffraction ion nitriding plasma focus super-austenitic stainless steels ion bombardment
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C. MacChi, J. Bürgi, J. G. Molleja, S. Mariazzi, M. Piccoli, E. Bemporad, J. Feugeas, R. Brusa, et al.
Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron
EPJ Applied Physics (cited By 3), 67(2), 2014
defects deposition depth profiling imaging techniques magnetrons positron annihilation spectroscopy reactive sputtering silicon substrates thin films x ray diffraction x ray spectroscopy aluminum nitride thin films deposition time doppler broadening spectroscopy energy dispersive x ray spectroscopy film-substrate interfaces morphological characterization open-volume defects substrate interface interfaces (materials)
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J. G. Molleja, M. Milanese, M. Piccoli, R. Moroso, J. Niedbalski, L. Nosei, J. Bürgi, E. Bemporad, et al.
Stability of expanded austenite, generated by ion carburizing and ion nitriding of AISI 316L SS, under high temperature and high energy pulsed ion beam irradiation
Surface and Coatings Technology (cited By 18), 218(1), 142-151, 2013
ablation austenite austenitic stainless steel carbon crystal structure ion beams ion bombardment irradiation lattice constants nitriding plasma stability surface reactions wear resistance expanded austenite high temperature high-energy pulsed microstructure changes partial amorphization plasma focus residual expansion temperature treatments ions
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