Journal Articles by R. Miranda
Hola !!
M. Ramos,
M. Minniti,
C. Díaz,
D. Farías,
R. Miranda,
F. Martín,
A. Martínez, and
H. Busnengo
Environment-driven reactivity of H2 on PdRu surface alloys
Physical Chemistry Chemical Physics (cited By 13),
15(36),
14936-14940,
2013
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M. Nĩo,
J. Camarero,
L. Gómez,
J. Ferrón,
J. D. Miguel, and
R. Miranda
Surfactant-assisted epitaxial growth and magnetism of Fe films on Cu(111)
Journal of Physics Condensed Matter (cited By 8),
20(26),
2008
binary alloys
copper alloys
iron
iron alloys
magnetism
molecular beam epitaxy
surface active agents
early growth
magnetic behavior
magnetic characteristic
structural modifications
structure
morphology
surfactant assisted
surfactant monolayers
thin epitaxial layer
interfaces (materials)
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L. Gómez,
C. Slutzky,
J. Ferrón,
J. D. L. Figuera,
J. Camarero,
A. D. Parga,
J. D. Miguel, and
R. Miranda
Novel microscopic mechanism of intermixing during growth on soft metallic substrates
Physical Review Letters (cited By 33),
84(19),
4397-4400,
2000
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J. Ferrón,
L. Gómez,
J. Gallego,
J. Camarero,
J. Prieto,
V. Cros,
A. V. D. Parga,
J. D. Miguel,
et al.
Influence of surfactants on atomic diffusion
Surface Science (cited By 33),
459(1),
135-148,
2000
computer simulation
copper
diffusion in solids
epitaxial growth
helium
interfaces (materials)
lead
monte carlo methods
scanning tunneling microscopy
atomistic dynamics
surface active agents
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DOI,
RIS,
BibTex
Hola !!
J. Camarero,
V. Cros,
M. Capitán,
J. Álvarez,
S. Ferrer,
M. Niño,
J. Prieto,
L. Gómez,
et al.
Epitaxial growth of metals with high Ehrlich-Schwoebel barriers and the effect of surfactants
Applied Physics A: Materials Science and Processing (cited By 21),
69(5),
553-557,
1999
copper
film growth
lead
metallic films
monolayers
surface active agents
ehrlich-schwoebel barriers
epitaxial growth
URL,
DOI,
RIS,
BibTex
Hola !!
J. Camarero,
J. Ferrón,
V. Cros,
L. Gómez,
A. V. de Parga,
J. Gallego,
J. Prieto,
J. de Miguel,
et al.
Atomistic mechanism of surfactant-assisted epitaxial growth
Physical Review Letters (cited By 122),
81(4),
850-853,
1998
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DOI,
RIS,
BibTex