Publications with the keyword "morphological characterization"

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L. Imhoff, S. Barolin, N. Pellegri, and M. Stachiotti
Sol-gel synthesis and characterization of 0.5Pb(Zr0.52Ti0.48)O3-0.5Pb(Fe0.5Nb0.5)O3 thin films
Ferroelectrics (cited By 1), 545(1), 1-9, 2019
chelation ferroelectric films perovskite rapid thermal annealing sol-gel process conventional furnace annealing ferromagnetic behaviors modified sol-gel process morphological characterization multiferroics perovskite phase formation platinized silicon substrates rapid thermal annealing (rta) thin films
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C. MacChi, J. Bürgi, J. G. Molleja, S. Mariazzi, M. Piccoli, E. Bemporad, J. Feugeas, R. Brusa, et al.
Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron
EPJ Applied Physics (cited By 3), 67(2), 2014
defects deposition depth profiling imaging techniques magnetrons positron annihilation spectroscopy reactive sputtering silicon substrates thin films x ray diffraction x ray spectroscopy aluminum nitride thin films deposition time doppler broadening spectroscopy energy dispersive x ray spectroscopy film-substrate interfaces morphological characterization open-volume defects substrate interface interfaces (materials)
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