Publications with the keyword "thin films"

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L. Isola, B. Malvasio, M. Giordana, and J. Malarria
Effect of the precipitates on the thermodynamics of the martensitic transformations in Ti-rich Ni-Ti-Co thin films
Journal of Alloys and Compounds (cited By 0), 818, 2020
annealing binary alloys calorimeters cobalt alloys differential scanning calorimetry elasticity friction hysteresis linear transformations martensitic transformations nickel alloys shape-memory alloy sputtering temperature ternary alloys thermodynamics thermoelasticity thin films annealing temperatures characteristic temperature martensitic phase transformations multiple transformation niti shape memory alloys thermal hysteresis thermoelastic martensitic transformations transformation temperatures titanium alloys
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L. Imhoff, S. Barolin, N. Pellegri, and M. Stachiotti
Sol-gel synthesis and characterization of 0.5Pb(Zr0.52Ti0.48)O3-0.5Pb(Fe0.5Nb0.5)O3 thin films
Ferroelectrics (cited By 1), 545(1), 1-9, 2019
chelation ferroelectric films perovskite rapid thermal annealing sol-gel process conventional furnace annealing ferromagnetic behaviors modified sol-gel process morphological characterization multiferroics perovskite phase formation platinized silicon substrates rapid thermal annealing (rta) thin films
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J. G. Molleja, J. Bürgi, G. Kellermann, A. Craievich, R. Neuenschwander, P.-Y. Jouan, M. Djouadi, M. Piccoli, et al.
Synchrotron radiation applied to real-Time studies of the kinetics of growth of aluminum nitride thin multilayers
Journal of Physical Chemistry B (cited By 0), 123(7), 1679-1687, 2019
aluminum nitride amorphous films film preparation growth kinetics magnetrons nitrides reactive sputtering superconducting films synchrotron radiation synchrotrons textures x ray diffraction aluminum nitride thin films controlled deposition experimental devices operation parameters polycrystalline structure real-time recording real-time x-ray diffraction superconducting wiggler thin films
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L. Imhoff, S. Barolin, N. Pellegri, and M. Stachiotti
Chelate route for the synthesis of PbZrxTi1−xO3 thin films
Journal of Sol-Gel Science and Technology (cited By 1), 83(2), 375-381, 2017
amorphous films chelation chemicals deposition distillation ferroelectric films ferroelectric materials ferroelectricity film growth lanthanum compounds perovskite rapid thermal annealing titanium chemical solution deposition conventional furnace dielectric ferroelectric properties ferroelectric property formation process inlinemediaobject perovskite phasis solution synthesis thin films
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F. Roudet, D. Chicot, X. Decoopman, A. Iost, J. Bürgi, J. Garcia-Molleja, L. Nosei, and J. Feugeas
Modeling of very thin aluminum nitride film mechanical properties from nanoindentation measurements
Thin Solid Films (cited By 4), 594, 129-137, 2015
aluminum aluminum nitride elastic moduli film thickness hardness mechanical properties models nanoindentation nitrides aluminum nitride films elastic modulus determination hardness elastic modulus indentation measurements indentation testing nano-indentation measurements the standard model weight functions thin films
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F. Roudet, D. Chicot, X. Decoopman, A. Iost, J. Burgi, J. G. Molleja, and J. Feugeas
Mechanical properties by indentation of aluminium nitride nanometric thin film [Proprietes mecaniques par indentation d'un film mince nanometrique de nitrure d'aluminium]
Materiaux et Techniques (cited By 0), 103(6), 2015
aluminum aluminum coatings aluminum nitride analytical models elastic moduli film thickness hardness mechanical properties nanoindentation nitrides substrates aluminum nitride films direct measurement elastic modulus determination fitting parameters hardness elastic modulus hardness determination indentation load nanometric thin films thin films
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A. Candia, L. Gómez, R. Vidal, J. Ferrón, and M. Passeggi
An STM and Monte Carlo study of the AlF3 thin film growth on Cu(1 1 1)
Journal of Physics D: Applied Physics (cited By 2), 48(26), 2015
agglomeration copper diffusion interfaces (materials) monolayers monte carlo methods scanning tunneling microscopy thin films adsorbed molecules aluminium fluoride corrugated surfaces diffusion length diffusion-aggregation model metal interface metropolis monte carlo qualitative differences film growth
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C. MacChi, J. Bürgi, J. G. Molleja, S. Mariazzi, M. Piccoli, E. Bemporad, J. Feugeas, R. Brusa, et al.
Depth profiling and morphological characterization of AlN thin films deposited on Si substrates using a reactive sputter magnetron
EPJ Applied Physics (cited By 3), 67(2), 2014
defects deposition depth profiling imaging techniques magnetrons positron annihilation spectroscopy reactive sputtering silicon substrates thin films x ray diffraction x ray spectroscopy aluminum nitride thin films deposition time doppler broadening spectroscopy energy dispersive x ray spectroscopy film-substrate interfaces morphological characterization open-volume defects substrate interface interfaces (materials)
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J. Bürgi, R. Neuenschwander, G. Kellermann, J. Molleja, A. Craievich, and J. Feugeas
Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction
Review of Scientific Instruments (cited By 3), 84(1), 2013
aln thin films amorphous thin films controlled deposition gas pressures grazing incidence small-angle x-ray scattering growth process polycrystalline processing parameters reactive sputter real time scanning mode structural studies synchrotron beamlines x ray reflectivity amorphous materials deposition scanning silicon wafers thin films x ray diffraction analysis vapor deposition
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A. Solarte, N. Pellegri, O. D. Sanctis, and M. Stachiotti
Effect of Li- and Ta-doping on the ferroelectric properties of Na 0.5K0.5NbO3 thin films prepared by a chelate route
Journal of Sol-Gel Science and Technology (cited By 4), 66(3), 488-496, 2013
conventional methods ferroelectric hysteresis loop ferroelectric property lead-free piezoelectrics leakage components remnant polarizations solution synthesis volatilization loss annealing chelation conductive films ferroelectric thin films ferroelectricity lithium niobium oxide optimization semiconductor doping sol-gels thin films ferroelectric films
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M. Santiago, R. Machado, M. Stachiotti, and O. D. Sanctis
Influence of tungsten doping on the ferroelectric behavior of Sr 0.8Bi2.3Ta2O9 thin films
Ferroelectrics (cited By 0), 406(1), 168-175, 2010
bismuth compounds ferroelectric films ferroelectric materials ferroelectricity semiconductor doping strontium compounds tantalum compounds tungsten annealing temperatures chemical solution deposition techniques dielectric ferroelectric properties dopant concentrations ferroelectric behavior ferroelectric property secondary phase substitution effect thin films
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J. Lesage, D. Chicot, L. Nosei, and J. Feugeas
Prediction of hardness-depth profile from indentations at surface of materials
Surface Engineering (cited By 6), 25(2), 93-96, 2009
argon hardening hardness indentation nitriding plasma applications stainless steel thin films calculation process coated systems depth profiles duplex process hardened materials hardness profiles high energies ion nitriding mechanical parts micro-indentation plasma beams short durations step by steps virtual layers surfaces
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R. MacHado, M. Santiago, M. Stachiotti, A. Frattini, N. Pellegri, R. Bolmaro, and O. D. Sanctis
Effects of acetoin as chelating agent on the preparation of SrBi 2Ta2O9 thin films from non-hydrolyzing precursors
Journal of Sol-Gel Science and Technology (cited By 4), 48(3), 294-302, 2008
agents alkaline earth metals bismuth chelation crystal microstructure crystal orientation crystallization ferroelectric films ferroelectric materials ferroelectric thin films ferroelectricity grain size shape ketones methanol microstructure nanocrystalline alloys nitrates organic compounds organic solvents powders segregation (metallography) strontium tantalum thick films thin films transition metals acetoin alkanolamines bismuth nitrates chelating agents chemical solution deposition techniques crystallinity crystallization processes dielectric ferroelectric properties ferroelectrics grain size distributions low temperatures microstructure evolutions organics phase formations precursor chemistries precursor chemistry precursor materials sbt secondary phases strontium bismuth tantalates surface micro structures tantalum ethoxide thermal evolutions film preparation
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M. Santiago, M. Stachiotti, R. MacHado, N. Pellegri, and O. D. Sanctis
Synthesis and characterization of PMN-PT thin films prepared by a new chemical route
Ferroelectrics (cited By 5), 370(14), 85-93, 2008
2-butanone acetoin average grain size chelating agent chemical routes chemical solution deposition crack-free films dielectric ferroelectric properties ethoxides lead acetate lead magnesium niobate-lead titanates multilayer process perovskite phase piezoelectrics pmn-pt pt precursors pt thin films si substrates starting materials synthesis characterization titanium butoxide atomic force microscopy chelation deposition ferroelectricity film preparation ketones magnesium methanol niobium niobium compounds organic solvents oxide minerals perovskite phototransistors synthesis (chemical) thin films titanium multilayer films
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L. Rico, B. Gómez, J. Feugeas, and O. de Sanctis
Crystallization of amorphous zirconium thin film using ion implantation by a plasma focus of 1 kJ
Applied Surface Science (cited By 17), 254, 193-196, 2007
crystallization fused silica ion beams ion implantation irradiation thin films zirconium amorphous zirconium crystallizations energetic argon plasma focus silica glass substrates amorphous materials
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A. Díaz-Parralejo, F. Guiberteau, and R. Caruso
Influence of the heat-treatment on thickness and porosity of thin-films obtained by sol-gel route [Influencia del tratamlento térmico sobre el espesor y porosidad de películas delgadas de ZrO2 obtenidas por la ruta sol-gel]
Boletin de la Sociedad Espanola de Ceramica y Vidrio (cited By 2), 43(2), 477-479, 2004
coatings porosity sol-gel process sol-gels zirconia dip coating porosity evolutions sol-gel routes thermal densification thickness transmission spectrums zirconia film thin films
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A. Díaz-Parralejo, R. Caruso, A. Ortiz, and F. Guiberteau
Densification and porosity evaluation of ZrO2-3 mol.% Y 2O3 sol-gel thin films
Thin Solid Films (cited By 93), 458(12), 92-97, 2004
crystal structure densification porosity refractive index sol-gels synthesis (chemical) thin films yttrium alloys lorentz-lorenz expression transmission spectrometry zirconia films zirconia
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R. Trbojevich, N. Pellegri, A. Frattini, O. de Sanctis, P. Morais, and R. Almeida
Preparation and isolation of gold nanoparticles coated with a stabilizer and sol-gel compatible agent
Journal of Materials Research (cited By 21), 17(8), 1973-1980, 2002
amines crystal growth gold micelles silanes silica sol-gels stabilizers (agents) thin films titanium dioxide amine silanes diamino silane gold nanoparticles micelle reverse technique particle growth sol-gel compatible agent nanostructured materials
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R. Caruso, A. Díaz-Parralejo, P. Miranda, and F. Guiberteau
Controlled preparation and characterization of multilayer sol-gel zirconia dip-coatings
Journal of Materials Research (cited By 26), 16(8), 2391-2398, 2001
atomic force microscopy ceramic coatings indentation microhardness microstructure multilayers porosity sol-gels stainless steel thin films x ray powder diffraction zirconia multilayer sol gel zirconia dip coatings protective coatings
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R. Caruso, F. Plá, A. Parralejo, and F. Guiberteau
Multilayer coatings preparation of zirconia-based by sol-gel route; microstructural and mechanical characterisation [Preparación de recubrimientos multicapa de base zirconia por vía sol-gel; caracterización microestructural y mecánica]
Revista de Metalurgia (Madrid) (cited By 1), 37(2), 311-315, 2001
ceramic coatings characterization hardness testing hydrolysis mechanical properties microstructure multilayers oxides substrates surface properties thin films zirconia berkovich ultramicrohardness test dip coating surface protection sol-gels
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N. Pellegri, A. Frattini, C. Steren, M. Rapp, R. Gil, R. Trbojevich, C. Oliver, and O. D. Sanctis
Chemical solution technique to prepare perovskite PZT and PLZT thin films and powders
Integrated Ferroelectrics (cited By 4), 30(14), 111-119, 2000
chemical operations crystal structure crystallization differential thermal analysis fourier transform infrared spectroscopy nuclear magnetic resonance spectroscopy organometallics semiconducting lead compounds spin coating synthesis (chemical) x ray diffraction analysis zirconium acetylacetonate alcoholisis chemical solution deposition technique rapid thermal processing thin films
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R. Caruso, O. D. Sanctis, A. Frattini, C. Steren, and R. Gil
Synthesis of precursors for chemical solution deposition of PZT thin films
Surface and Coatings Technology (cited By 22), 122(1), 44-50, 1999
dehydration deposition fourier transform infrared spectroscopy molecular structure nuclear magnetic resonance spectroscopy sol-gels synthesis (chemical) thin films titanium compounds zinc compounds alcoholysis lead zirconate titanate lead compounds
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R. Caruso, N. Pellegri, O. D. Sanctis, P. Rivas, and M. Caracoche
Comparative Study of Sol-Gel Derived 2.5% and 11.3% Y2O3-ZrO2 by Perturbed Angular Correlations Spectroscopy
Journal of Sol-Gel Science and Technology (cited By 2), 8(13), 223-227, 1997
activation energy ceramic materials diffusion doping (additives) heat treatment powders spectroscopic analysis thermal effects thermodynamic stability thin films yttrium compounds zirconia perturbed angular correlations (pac) spectroscopy phase structures thermal transformations sol-gels
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